By Manoj Sachdev,José Pineda de Gyvez
ISBN-10: 0387465464
ISBN-13: 9780387465463
ISBN-10: 1441942858
ISBN-13: 9781441942852
The 2nd version of illness orientated checking out has been largely up-to-date. New chapters on practical, Parametric disorder types and Inductive fault research and Yield Engineering were further to supply a hyperlink among disorder resources and yield. The bankruptcy on RAM checking out has been up-to-date with specialize in parametric and SRAM balance trying out. equally, more recent fabric has been included in electronic fault modeling and analog trying out chapters. The energy of disorder orientated trying out for nano-Metric CMOS VLSIs lies in its business relevance.
Read Online or Download Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits: 34 (Frontiers in Electronic Testing) PDF
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Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits: 34 (Frontiers in Electronic Testing) by Manoj Sachdev,José Pineda de Gyvez
by Steven
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