By Manoj Sachdev,José Pineda de Gyvez
The 2nd version of illness orientated checking out has been largely up-to-date. New chapters on practical, Parametric disorder types and Inductive fault research and Yield Engineering were further to supply a hyperlink among disorder resources and yield. The bankruptcy on RAM checking out has been up-to-date with specialize in parametric and SRAM balance trying out. equally, more recent fabric has been included in electronic fault modeling and analog trying out chapters. The energy of disorder orientated trying out for nano-Metric CMOS VLSIs lies in its business relevance.
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The second version of disorder orientated trying out has been commonly up-to-date. New chapters on practical, Parametric illness types and Inductive fault research and Yield Engineering were additional to supply a hyperlink among illness assets and yield. The bankruptcy on RAM checking out has been up-to-date with specialise in parametric and SRAM balance checking out.
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Extra info for Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits: 34 (Frontiers in Electronic Testing)
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits: 34 (Frontiers in Electronic Testing) by Manoj Sachdev,José Pineda de Gyvez